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Publications by E. Passaglia

Treasure of the Past VII: Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry

Journal of Research of the National Institute of Standards and Technology

English

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Measurement of Complex Refractive Index of Tungsten by Using Ellipsometry

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Optical Characterization of Thin Au Films by Standard and Polaritonic Ellipsometry

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Determination of Thickness and Refractive Index of Thin Films as an Approach to the Study of Biological Macromolecules

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The Impact of Thickness and Thermal Annealing on Refractive Index for Aluminum Oxide Thin Films Deposited by Atomic Layer Deposition

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Simultaneous Measurement of Thickness and Refractive Index of Film by Using Spectral Analysis

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The Optical Properties of Very Thin-Layer CdTe/ZnSe

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Properties of the Cladding Modes of an Optical Fibre Excited by Refractive-Index Gratings

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