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Publications by Ellis Kennedy
Tilted Fluctuation Electron Microscopy Characterization of Magnetically Anisotropic Amorphous Metal Films
Microscopy and Microanalysis
Instrumentation
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Electron Microscopy Study of Ni Induced Crystallization in Amorphous Si Thin Films
Simulation of Decoherence in Fluctuation Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Fluctuation Electron Microscopy for the MASses
Microscopy and Microanalysis
Instrumentation
High-Resolution Electron Microscopy and Microdiffraction of MgO–metal Composite Films
Acta Crystallographica Section A Foundations of Crystallography
Microstructural Characterization of Metal Matrix Composites by Analytical Electron Microscopy
Microscopy Microanalysis Microstructures
Erratum: Stability of Amorphous Transition‐metal Films
Journal of Applied Physics
Astronomy
Physics
Nanoindentation Study of Amorphous Metal Multilayered Thin Films
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Characterization of Metal-Doped Mn3O4 Particles by Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy
Microscopy and Microanalysis
Instrumentation
Preparation of Carbon Films for Electron Microscopy
Vacuum
Surfaces
Instrumentation
Coatings
Condensed Matter Physics
Films