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Publications by Eric R.
Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy
Pet/Ct
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Direct Assessment of P–n Junctions in Single GaN Nanowires by Kelvin Probe Force Microscopy
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Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy
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Protocol Optimisation for Work-Function Measurements of Metal Gates Using Kelvin Force Microscopy
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