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Publications by Eric R.
Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy
Pet/Ct
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Kelvin Probe Measurements of Microcrystalline Silicon on a Nanometer Scale Using SFM
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Direct Assessment of P–n Junctions in Single GaN Nanowires by Kelvin Probe Force Microscopy
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Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy
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Protocol Optimisation for Work-Function Measurements of Metal Gates Using Kelvin Force Microscopy
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Scanning Probe Microscopy in TEM : An In-Situ Approach for Nano-Scale Property Measurements
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Potential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy
