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Publications by F. Della Corte
Au, Ag and Cu-Silicon RCE Photodetectors Based on the Internal Photoemission Effect at 1.55 Micron
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Silicon Photodetectors Based on Internal Photoemission Effect: The Challenge of Detecting Near-Infrared Light
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Effect of Melting Temperature on Wettability of Sn-Ag-Cu Alloys on Cu Substrate
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