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Publications by F. Gámiz
Role of Surface-Roughness Scattering in Double Gate Silicon-On-Insulator Inversion Layers
Journal of Applied Physics
Astronomy
Physics
Related publications
Surface Roughness at the Si–SiO2 Interfaces in Fully Depleted Silicon-On-Insulator Inversion Layers
Journal of Applied Physics
Astronomy
Physics
Electron Mobility in Double Gate Silicon on Insulator Transistors: Symmetric-Gate Versus Asymmetric-Gate Configuration
Journal of Applied Physics
Astronomy
Physics
Monte Carlo Simulation of Double Gate Silicon on Insulator Devices Operated as Velocity Modulation Transistors
Applied Physics Letters
Astronomy
Physics
Roughness Analysis in Strained Silicon-On-Insulator Wires and Films
Journal of Applied Physics
Astronomy
Physics
Enhanced Spontaneous Raman Scattering in Silicon Photonic Crystal Waveguides on Insulator
Optics Express
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Atomic
Molecular Physics,
Phonon-Boundary Scattering in Thin Silicon Layers
Applied Physics Letters
Astronomy
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A Comprehensive Model for Coulomb Scattering in Inversion Layers
Journal of Applied Physics
Astronomy
Physics
Effect of Double-Patterning and Double-Etching on the Line-Edge-Roughness of Multi-Gate Bulk MOSFETs
IEICE Electronics Express
Electronic Engineering
Condensed Matter Physics
Optical
Electrical
Magnetic Materials
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Influence of Self-Affine Roughness on Parsons-Zobel Plots for Electrical Double Layers
Physical Review E