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Publications by F. Minari
Characterization of the Cellular Growth Structure of GaAs-0.2 At% in by X-Ray Topography
Acta Crystallographica Section A Foundations of Crystallography
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X-Ray Topography: X-Ray Topography Characterization of the Bridgman-Grown Crystals of Zinc Germanium Phosphide (Crystal Research and Technology 11/2018)
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Synchrotron Topography and X-Ray Diffraction Study of GaInP Layers Grown on GaAs/Ge
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Nitride Semiconductor Surfaces. Characterization of Initial Growth Stage of GaInN Multilayered Structure by X-Ray CTR Scattering and X-Ray Reflectivity Method.
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Projection X-Ray Topography System at 1-Bm X-Ray Optics Test Beamline at the Advanced Photon Source
