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Publications by F. Okuyama
Structural Investigation of keV Ar-Ion-Induced Surface Ripples in Si by Cross-Sectional Transmission Electron Microscopy
Physical Review B
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Cross-Sectional Transmission Electron Microscopy Analysis of {311} Defects From Si Implantation Into Silicon
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Cross-Sectional Examination of Crystallinity of Carbon Fibers by Transmission Electron Microscopy
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Nitridation Mechanism of Si Compacts Studied by Transmission Electron Microscopy
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In-Situ Growth of MnAs Nanocrystals in Si Studied by Transmission Electron Microscopy
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Investigation of 6T@SWCNT by Cs-Corrected Transmission Electron Microscopy
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Imaging Surface Plasma of Metals by Ultrafast Transmission Electron Microscopy
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Analysis of a Wafer Bonded Ge∕Si Heterojunction by Transmission Electron Microscopy
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Investigation of Grain Boundaries in BaSi2 Epitaxial Films on Si(1 1 1) Substrates Using Transmission Electron Microscopy and Electron-Beam-Induced Current Technique
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Electron Beam Induced Domain Motion in Ferroelectric RKTP Observed by Transmission Electron Microscopy
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