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Publications by F.L. McCrackin

Treasure of the Past VII: Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry

Journal of Research of the National Institute of Standards and Technology

English

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Optical Properties of High Refractive Index Thin Films Processed at Low-Temperature

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Measurement of Complex Refractive Index of Tungsten by Using Ellipsometry

IEEJ Transactions on Fundamentals and Materials

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Optical Characterization of Thin Au Films by Standard and Polaritonic Ellipsometry

Semiconductor Physics, Quantum Electronics and Optoelectronics

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Determination of Thickness and Refractive Index of Thin Films as an Approach to the Study of Biological Macromolecules

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Thermo Optical Properties and Related Electronic Polarizabilities of MoO3 Thin Films Using Ellipsometry

American Journal of Engineering and Applied Sciences

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The Impact of Thickness and Thermal Annealing on Refractive Index for Aluminum Oxide Thin Films Deposited by Atomic Layer Deposition

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Simultaneous Measurement of Thickness and Refractive Index of Film by Using Spectral Analysis

Transactions of the Society of Instrument and Control Engineers

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The Optical Properties of Very Thin-Layer CdTe/ZnSe

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Properties of the Cladding Modes of an Optical Fibre Excited by Refractive-Index Gratings

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