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Publications by F.M. Klaassen
Effect of Gate-Field Dependent Mobility Degradation on Distortion Analysis in MOSFETs
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Related publications
Linearity and Mobility Degradation in Strained Si MOSFETs With Thin Gate Dielectrics
Solid-State Electronics
Electronic Engineering
Condensed Matter Physics
Materials Chemistry
Optical
Electrical
Magnetic Materials
Electronic
Effect of Polysilicon Depletion Charge on Electron Mobility in Ultrathin Oxide MOSFETs
Semiconductor Science and Technology
Electronic Engineering
Condensed Matter Physics
Optical
Materials Chemistry
Electrical
Magnetic Materials
Electronic
Gate Voltage Dependent 1/F Noise Variance Model in N-Channel MOSFETs
Hall Mobility Measurements in Enhancement-Mode GaAs Field-Effect Transistors With Al2O3 Gate Dielectric
Applied Physics Letters
Astronomy
Physics
Model and Analysis of Gate Leakage Current in Ultrathin Nitrided Oxide MOSFETs
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
The Temperature Dependence of the Electron Mobility Degradation Mechanisms in N-Channel Metal-Oxide-Semiconductor Field Effect Transistors With ZrO2 and Sm2O3 Gate Dielectrics
Applied Physics Letters
Astronomy
Physics
Interfacial Gate Resistance in Schottky-Barrier-Gate Field-Effect Transistors
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Research on Microwave Junction Gate Field Effect Transistors.
Investigation of Degradation Effects Due to Gate Stress in GaN-on-Si High Electron Mobility Transistors Through Analysis of Low Frequency Noise
