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Publications by Farisal Abdullah
Failure Analysis Using IDD Current Leakage and Photo Localization for Gate Oxide Defect of CMOS VLSI
Related publications
Impact of Gate Induced Drain Leakage on Overall Leakage of Submicrometer CMOS VLSI Circuits
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Runtime Mechanisms for Leakage Current Reduction in CMOS VLSI Circuits
Model and Analysis of Gate Leakage Current in Ultrathin Nitrided Oxide MOSFETs
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Simultaneous Control of Subthreshold and Gate Leakage Current in Nanometer-Scale CMOS Circuits
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An Algorithm for Leakage Power Reduction Through IVC in CMOS VLSI Digital Circuits
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Leakage Current in Deep-Submicron Cmos Circuits
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