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Publications by Franz J. Giessibl

CO Tip Functionalization Inverts Atomic Force Microscopy Contrast via Short-Range Electrostatic Forces

Physical Review Letters

English

Calculation of the Optimal Imaging Parameters for Frequency Modulation Atomic Force Microscopy

Applied Surface Science

Condensed Matter Physics

English

Related publications

A Near Real-Time Framework for Extracting Tip-Sample Forces in Dynamic Atomic Force Microscopy

English

Long-Range Electrostatic Forces

Europhysics News

English

Effect of Tip Geometry on Local Indentation Modulus Measurement via Atomic Force Acoustic Microscopy Technique

Review of Scientific Instruments

Instrumentation

English

Quantification of Atomic Force Microscopy Tip and Sample Thermal Contact

Review of Scientific Instruments

Instrumentation

English

An Intensive Short Course on Atomic-Force Microscopy

English

Polarization Contrast in Photon Scanning Tunnelling Microscopy Combined With Atomic Force Microscopy

Journal of Microscopy

Forensic Medicine

English

Evaluation of Tip Performance by XE-100 Atomic Force Microscopy (AFM)

Microscopy and Microanalysis

Instrumentation

English

Atomic Force Microscopy

English

Reproducible Nanostructure Fabrication Using Atomic Force Microscopy Indentation With Minimal Tip Damage

Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics

Electronic Engineering

Condensed Matter Physics

Instrumentation

Materials Chemistry

Magnetic Materials

Process Chemistry

English