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Publications by G. Bersuker

Degradation of Polycrystalline HfO2-based Gate Dielectrics Under Nanoscale Electrical Stress

Applied Physics Letters

English

Monitoring Defects in III–V Materials: A Nanoscale CAFM Study

Microelectronic Engineering

Electronic Engineering

Condensed Matter Physics

Molecular Physics,

Magnetic Materials

English

Metal-Gate-Induced Reduction of the Interfacial Layer in Hf Oxide Gate Stacks

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Condensed Matter Physics

English

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