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Publications by G. Brunthaler

Triple Axis X‐ray Investigations of Semiconductor Surface Corrugations

Journal of Applied Physics

English

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A Triple Axis Double Crystal Multiple Reflection Camera for Ultra Small Angle X-Ray Scattering

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X-Ray Diffraction From Semiconductor Nanostructures

Acta Crystallographica Section A Foundations of Crystallography

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X-Ray Surface Diffraction.

Bulletin of the Japan Institute of Metals

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cBright Off-Axis Directional Emission With Plasmonic Corrugations

Molecular Physics,

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X-Ray Investigations of Mn3P, Mn2P, and Ni2P.

Acta Chemica Scandinavica

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Metal/Semiconductor Interfaces Studied by X-Ray Diffraction.

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Characterization of Surface Structure. X-Ray Surface Diffraction.

Nihon Kessho Gakkaishi

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X-Ray Standing-Wave Investigations of Valence Electronic Structure

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Investigations of Vacuum Ultraviolet and Soft X-Ray Lasers.

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