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Publications by G. H. Buh

Quantification of Shallow-Junction Dopant Loss During CMOS Process

AIP Conference Proceedings

English

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Antimony Behavior in Laser Annealing Process for Ultra Shallow Junction Formation

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Quantification of Gap Junction Selectivity

American Journal of Physiology - Cell Physiology

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DOPANT INCORPORATION DURING LP-VPE OF GaAs

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Mapping of Process Induced Dopant Redistributions by Electron Holography

Microscopy and Microanalysis

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A Stacked Inverter-Based CMOS Power Amplifier in 65nm CMOS Process

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Controlling Dopant Profiles in Hyperdoped Silicon by Modifying Dopant Evaporation Rates During Pulsed Laser Melting

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CMOS Buried Quad P-N Junction Photodetector for Multi-Wavelength Analysis

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Thermal Stability of Titanium Nitride for Shallow Junction Solar Cell Contacts

Journal of Applied Physics

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Infrared Photothermal Radiometric Deep-Level Transient Spectroscopy of Shallow B+ Dopant States in P-Si

Applied Physics Letters

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