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Publications by G. Tessier
Multiple Wavelength Reflectance Microscopy to Study the Multiphysical Behavior of Microelectromechanical Systems
Optics Letters
Optics
Atomic
Molecular Physics,
Thickness-Dependent Thermal Properties of Amorphous Insulating Thin Films Measured by Photoreflectance Microscopy
Thin Solid Films
Surfaces
Alloys
Optical
Interfaces
Metals
Materials Chemistry
Magnetic Materials
Films
Coatings
Electronic
Related publications
Microelectromechanical Systems
Microelectromechanical Systems (Mems) Technology
Representing Knowledge About Microelectromechanical Systems in Information Systems
Politechnical student journal
Introduction to Silicon Carbide (Sic) Microelectromechanical Systems (Mems)
Ptychographic Microscopy via Wavelength Scanning
APL Photonics
Computer Networks
Communications
Optics
Atomic
Molecular Physics,
Study of Possible Synergetic Effects in Microelectromechanical Systems on the Basis of Silicon-On-Insulator Structures
Nanotechnology Research and Practice
Effective Behavior on Multiple Linear Systems
Asian Journal of Mathematics
Mathematics
Applied Mathematics
Tunable Patch Antennas Using Microelectromechanical Systems
Skin Cancer Diagnosis With Reflectance Confocal Microscopy
JAMA Dermatology
Dermatology
Medicine
