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Publications by GA Botton
Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si
Microscopy and Microanalysis
Instrumentation
Investigation of 6T@SWCNT by Cs-Corrected Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Related publications
Aberration-Corrected HRTEM of Defects in Strained Lanthanum Cuprate Thin Films Grown on Strontium Titanate
Microscopy and Microanalysis
Instrumentation
On Proper Phase Contrast Imaging in Aberration Corrected TEM
Microscopy and Microanalysis
Instrumentation
Nanomilling for Aberration – Corrected TEM and HAADF STEM
Microscopy and Microanalysis
Instrumentation
TEM Investigation of Er2O3 Thin Films Grown on Si (100) by Laser MBE
Microscopy and Microanalysis
Instrumentation
State of the First Aberration-Corrected, Monochromized 200kV FEG-TEM
Microscopy and Microanalysis
Instrumentation
Advancement of Heteroepitaxial III-V/Si Thin Films Through Defect Characterization
Microscopy and Microanalysis
Instrumentation
Revealing Formation Mechanism of Self-Induced InAlN Core-Shell Nanorods by Aberration-Corrected TEM
Novel Adiabatic Coupler for III-V Nano-Ridge Laser Grown on a Si Photonics Platform
Optics Express
Optics
Atomic
Molecular Physics,
Monoclinic Symmetry of Twin-Free Nanocrystals in theBiScO3-PbTiO3solid Solution as Revealed by Aberration-Corrected TEM
Physical Review B
