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Publications by Gaofa He
Experiment of Polarization Forces in Scanning Electrostatic Force Microscopy for Measuring Surface Profile of Dielectric
Open Electrical and Electronic Engineering Journal
Electronic Engineering
Electrical
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Polarization Contrast in Photon Scanning Tunnelling Microscopy Combined With Atomic Force Microscopy
Journal of Microscopy
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Three-Dimensional Electrostatic Interactions in Dynamic Force Microscopy: Experiment and Theory
Physical Review B
Influence of Surface Acoustic Waves on Lateral Forces in Scanning Force Microscopies
Journal of Applied Physics
Astronomy
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CO Tip Functionalization Inverts Atomic Force Microscopy Contrast via Short-Range Electrostatic Forces
Physical Review Letters
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Ultrahigh Dielectric Constant of Thin Films Obtained by Electrostatic Force Microscopy and Artificial Neural Networks
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An Improved Scan Mode in an Electrostatic Force Microscope for Surface Profile Measurement of Micro-Optics
Journal of Advanced Mechanical Design, Systems and Manufacturing
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Optically Induced Forces in Scanning Probe Microscopy
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Chemical Phenomena of Atomic Force Microscopy Scanning
High-Resolution Scanning Force Microscopy of Gold Nanoclusters on the KBr (001) Surface
Physical Review B