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Publications by Gregor Hlawacek
Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope
Microscopy and Microanalysis
Instrumentation
Imaging Structure and Magnetisation in New Ways Using 4D STEM
Microscopy and Microanalysis
Instrumentation
Related publications
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
Microscopy and Microanalysis
Instrumentation
Gridless Ion Acceleration Systems for Time-Of-Flight Mass Spectrometry
Journal of the American Society for Mass Spectrometry
Structural Biology
Spectroscopy
Ion Storage Techniques and Time-Of-Flight Mass Spectrometry in Physical Forensic Science
Towards Secondary Ion Mass Spectrometry on the Helium Ion Microscope: An Experimental and Simulation Based Feasibility Study With He+ and Ne+ Bombardment
Applied Physics Letters
Astronomy
Physics
Selective Reagent Ion-Time of Flight-Mass Spectrometry Study of Six Common Monoterpenes
International Journal of Mass Spectrometry
Instrumentation
Theoretical Chemistry
Condensed Matter Physics
Spectroscopy
Physical
Feasibility of Ultra-Performance Liquid Chromatography–ion Mobility–time-Of-Flight Mass Spectrometry in Analyzing Oxysterols
Journal of Chromatography A
Medicine
Organic Chemistry
Analytical Chemistry
Biochemistry
Writing Nanometer-Scale Pits in Sputtered Carbon Films Using the Scanning Tunneling Microscope
Applied Physics Letters
Astronomy
Physics
Chemical Imaging of Buried Interfaces in OrganicInorganic Devices Using Focused Ion Beam-Time-Of-Flight-Secondary-Ion Mass Spectrometry
Atom Probe Field Ion Microscope Study of the Range and Diffusivity of Helium in Tungsten
