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Publications by H-J Engelmann
In-Situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System
Microscopy and Microanalysis
Instrumentation
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Low Damage Sample Preparation of Semiconductor Materials Using Low Energy Ion Milling
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Ion-Beam Excitation of Liquid Argon
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In Situ Microfluidic Cryofixation for Cryo Focused Ion Beam Milling and Cryo Electron Tomography
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Precise SEM Cross Section Polishing via Argon Beam Milling
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Status of the SNS H− Ion Source and Low-Energy Beam Transport System
AIP Conference Proceedings
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Low-Energy Mass-Selected Ion Beam Deposition of Silicon Carbide With Bernas-Type Ion Source Using Methylsilane
AIP Advances
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Fabrication of Sub-5 Nm Nanochannels in Insulating Substrates Using Focused Ion Beam Milling
Nano Letters
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Scintillation Efficiency of Liquid Argon in Low Energy Neutron-Argon Scattering
Journal of Instrumentation
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Mathematical Physics
Using In-Situ TEM Triple Ion Beam Irradiations to Study the Effects of Deuterium, Helium, and Radiation Damage on TPBAR Components
Microscopy and Microanalysis
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