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Publications by H-J. L. Gossmann

Imaging Single Dopant Atoms and Nanoclusters in Highly N-Type Bulk Si

Microscopy and Microanalysis
Instrumentation
2002English

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Electric Field Imaging of Single Atoms

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3D Imaging of Si and Er Nanoclusters in Er Doped SiO1.5 Films by STEM Tomography

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