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Publications by H. El Rhaleb

Analysis of Bulk Sample Photothermal Response by Time Resolved Ellipsometry

Le Journal de Physique IV

English

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Angle-Resolved Ellipsometry of Light Scattering: Discrimination of Surface and Bulk Effects in Substrates and Optical Coatings

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Photothermal Ablation of Polystyrene Film by 248 NM Excimer Laser Irradiation: A Mechanistic Study by Time-Resolved Measurements

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Time-Resolved Imaging of Material Response Following Laser-Induced Breakdown in the Bulk and Surface of Fused Silica

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Analysis of Controlled Mixed-Phase (Amorphous+microcrystalline) Silicon Thin Films by Real Time Spectroscopic Ellipsometry

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

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Time-Resolved X-Ray Diffraction Techniques for Bulk Polycrystalline Materials Under Dynamic Loading

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Time-Resolved Analysis of Macromolecular Structures During Reactions by Stopped-Flow Electrooptics

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Time-Resolved Structural Study of Low-Index Surfaces of Germanium Near Its Bulk Melting Temperature

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Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.

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Analysis of Time-Resolved Gene Expression Measurements Across Individuals

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