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Publications by H. Helava
Determination of the Concentration of Impurities in GaN From Photoluminescence and Secondary-Ion Mass Spectrometry
Scientific Reports
Multidisciplinary
Defect-Related Luminescence in Undoped GaN Grown by HVPE
Journal of Electronic Materials
Electronic Engineering
Condensed Matter Physics
Optical
Materials Chemistry
Electrical
Magnetic Materials
Electronic
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Secondary Ion Mass Spectrometry (SIMS)
Zairyo to Kankyo/ Corrosion Engineering
Surfaces
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Metals
Materials Chemistry
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Secondary Ion Mass Spectrometry (SIMS)
Determination of the Deposition Order of Overlapping Latent Fingerprints and Inks Using Secondary Ion Mass Spectrometry
Analytical Chemistry
Analytical Chemistry
Determination of Trace Impurities in Tantalum Oxide Films by Inductively Coupled Plasma Mass Spectrometry Combined With Ion Exchange
Analytical Sciences
Analytical Chemistry
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
Microscopy and Microanalysis
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Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images
Microscopy and Microanalysis
Instrumentation
Characterization of Electrodeposited Metal Coatings by Secondary Ion Mass Spectrometry
Surface and Coatings Technology
Surfaces
Condensed Matter Physics
Interfaces
Materials Chemistry
Films
Coatings
Chemistry
Depth Profiling of Trace Constituents Using Secondary Ion Mass-Spectrometry
Journal of Research of the National Bureau of Standards
Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities
Microscopy and Microanalysis
Instrumentation
