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Publications by H. Kauppinen

An Experimental Comparison of Autoregressive and Fourier-Based Descriptors in 2D Shape Classification

IEEE Transactions on Pattern Analysis and Machine Intelligence

Pattern Recognition

Applied Mathematics

Computer Vision

Computational Theory

Artificial Intelligence

English

Identification of Vacancy Defects in Compound Semiconductors by Core-Electron Annihilation: Application to InP

Physical Review B

English