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Publications by H. T. Shin

Photonic Gated-Diode Method for Extracting the Energy-Dependent and the Spatial Distributions of Interface States in MOSFETs

Journal of the Korean Physical Society

English

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A New Charge-Pumping Technique for Profiling the Interface-States and Oxide-Trapped Charges in MOSFETs

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Sufficient Condition for the Existence of Interface States in Some Two-Dimensional Photonic Crystals

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FinFET Reliability Analysis by Forward Gated-Diode Method

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Back-Gated Buried Oxide MOSFETs in a High-Voltage Bipolar Technology for Bonded Oxide/Soi Interface Characterization

IEEE Electron Device Letters

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Mosfets Used in Ideal Diode Circuits for Lundell Alternator Rectifiers

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Extracting Information on the Spatial Variability in Erosion Rate Stored in Detrital Cooling Age Distributions in River Sands

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Diode Parameter Determination Applied to LDD-MOSFETs for Device Characterization

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Modifications of the Elutriation Method for Extracting Nematodes From Soil

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Optimization of Fluorine Plasma Treatment for Interface Improvement on HfO2/In0.53Ga0.47As MOSFETs

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