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Publications by H.T. Danga

Electrical Characterization of Defects Induced by Electron Beam Exposure in Low Doped N -GaAs

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

High Energy Physics

Instrumentation

English

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Electrical Characterization of Sputter Deposition Induced Defects in N-GaN

MRS Internet Journal of Nitride Semiconductor Research

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The Fine Structure of Electron Irradiation Induced EL2-like Defects in N-GaAs

Journal of Applied Physics

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Electrical Characteristics of GaAs Schottky Contacts Fabricated by Electron-Beam Deposition Technique.

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Electrical Characterization of P‐GaAs Epilayers Disordered by Doped Spin-On-Glass

Journal of Applied Physics

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Pulsed Electron Beam Induced Recrystallization and Damage in GaAs

Applied Physics Letters

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Optical Characterization of Si‐doped InAs1−xSbxgrown on GaAs and GaAs‐coated Si by Molecular‐beam Epitaxy

Journal of Applied Physics

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Electrical and Photoelectrical Characterization of Deep Defects in Cubic GaN on GaAs

MRS Internet Journal of Nitride Semiconductor Research

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Optically Active Defects Induced by 10 MeV Electron Beam in Transparent MgAl2O4 Ceramics

KnE Materials Science

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Effect of Atomic Hydrogen Exposure on Electron Beam Polarization From Strained GaAs Photocathodes

AIP Conference Proceedings

English