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Publications by Hiroyoshi SOEJIMA
Determination of the Compositions of Thin Film Compounds by Using the Electron-Probe X-Ray Microanalyzer. Analyses of Nitride Thin Films
SHINKU
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X-Ray Induced Modification of Electronic Properties of Boron Nitride Thin Films
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Characterization of SiGe Thin Films Using a Laboratory X-Ray Instrument
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Molecular Biology
Analyses of Morphologies in Block Copolymer Thin Films by Grazing Incidence Small Angle X-Ray Scattering
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Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)
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Characterization of Nitride Thin Films Using SEM and EDX
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X-Ray Scattering Studies of Amorphous Thin Film Materials
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Characterization of Thin Polymer Films by Neutron and X-Ray Reflectometry
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Observation of Molecular Layering in Thin Liquid Films Using X-Ray Reflectivity
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Preparation of Boron Nitride Thin Films by Using Plasma Chemical Transport of Boron.
Journal of the Surface Finishing Society of Japan