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Publications by Ilona Mullerova

Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope

Microscopy and Microanalysis
Instrumentation
2018English

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Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope - Part 2

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Atomic-Resolution Electron Energy-Loss Spectroscopy in the Scanning Transmission Electron Microscope

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