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Publications by Ioannis Chasiotis
Microtensile Tests With the Aid of Probe Microscopy for the Study of MEMS Materials
Related publications
Nano-Scale Characterization of Materials by Atom Probe Field Ion Microscopy.
Bulletin of the Japan Institute of Metals
Study of Micro-Tribology Using Scanning Probe Microscopy.
Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
Mechanical Engineering
Electronic Behaviors of Individual Defects and Boundaries in 2D Materials: A Spatially Resolved Study With Multi-Probe Scanning Tunneling Microscopy
Microscopy and Microanalysis
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The COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF a Ni-Base SUPERALLOY
Le Journal de Physique Colloques
Microtensile Bond Strength and Nanoleackage of Dentin Surfaces Pretreated With Different Etching Materials
Egyptian Dental Journal
Growth of Nanotubes for Probe Microscopy Tips
Nature
Multidisciplinary
Reliability Characterization of MEMS Materials
IEEJ Transactions on Sensors and Micromachines
Electronic Engineering
Electrical
Mechanical Engineering
The Electron Microscopy of Superconducting Materials
Acta Crystallographica Section A: Foundations and Advances
Materials Science
Condensed Matter Physics
Theoretical Chemistry
Biochemistry
Structural Biology
Inorganic Chemistry
Physical
Scanning Probe Microscopy of Elastomers With Mineral Fillers
