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Publications by Jürgen W. Gerlach

Research Update: Van-Der-Waals Epitaxy of Layered Chalcogenide Sb2Te3 Thin Films Grown by Pulsed Laser Deposition

Materials Science

English

Nitrogen at theSi-nanocrystal/SiO2interface and Its Influence on Luminescence and Interface Defects

Physical Review B

English

X-Ray Elastic Constants Determined by the Combination of Sin2ψ and Substrate-Curvature Methods

Zeitschrift für Metallkunde

English