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Publications by J L Mey
Characterization of Epitaxial Bands and Electron Beam Damage in Natural Zircon Using Cathodoluminescence.
Microscopy and Microanalysis
Instrumentation
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Electron-Beam-Induced Annealing of Natural Zircon: A Raman Spectroscopic Study
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Response of Cathodoluminescence to Crystal-Plastic Deformation in Zircon
Chemical Geology
Petrology
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Three-Dimensional Cathodoluminescence by Focused Ion Beam - Scanning Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Electron Beam Induced Damage in Wurtzite InN
Microscopy and Microanalysis
Instrumentation
Pulsed Electron Beam Induced Recrystallization and Damage in GaAs
Applied Physics Letters
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Reducing Electron Beam Damage With Multipass Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Microscale Characterisation of Epitaxial Semiconducting Homolayers. - I. Cathodoluminescence
Microscopy Microanalysis Microstructures
Characterisation of Epitaxial Lateral Overgrown GaN by Electron Backscatter Diffraction Correlated With Cross-Sectional Cathodoluminescence Spectroscopy
Microscopy and Microanalysis
Instrumentation
Cathodoluminescence Spectra Acquisition Using an Imaging Spectrograph and CCD Detector: Materials Characterization Using Trivalent REE Doped Synthetic and Natural Materials
Microscopy and Microanalysis
Instrumentation
