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Publications by J Lefman

Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images

Microscopy and Microanalysis
Instrumentation
2010English

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Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities

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New Approach for Improvement of Secondary Ion Mass Spectrometry Profile Analysis

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Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging

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Quantitative Analysis of Zn-Fe Alloy Galvanized Layer by Secondary Ion Mass Spectrometry

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Depth Profiling of Trace Constituents Using Secondary Ion Mass-Spectrometry

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20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)

Biointerphases
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