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Publications by J Summhammer
Kelvin Probe Measurements of Microcrystalline Silicon on a Nanometer Scale Using SFM
Solar Energy Materials and Solar Cells
Surfaces
Renewable Energy
Sustainability
Optical
Magnetic Materials
Films
Coatings
Electronic
the Environment
Related publications
Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy
Nanometer-Scale Deposition of Metal Plating Using a Nanopipette Probe in Liquid Condition
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Time-Resolved Photoconductivity as a Probe of Carrier Transport in Microcrystalline Silicon
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Scanning Probe-Based Processes for Nanometer-Scale Device Fabrication
Modulating Light on the Nanometer Scale Using Polyvalent Metal
SPIE Newsroom
Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination
Nanoscale Research Letters
Materials Science
Nanotechnology
Condensed Matter Physics
Nanoscience
Observing Optical Plasmons on a Single Nanometer Scale
Scientific Reports
Multidisciplinary
Direct Measurement of Minority Carriers Diffusion Length Using Kelvin Probe Force Microscopy
Applied Physics Letters
Astronomy
Physics
Scanning Probe Energy Loss Spectroscopy: Angular Resolved Measurements on Silicon and Graphite Surfaces
Applied Physics Letters
Astronomy
Physics
