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Publications by J. A. Woollam

Temperature Dependent Effective Mass in AlGaN/GaN High Electron Mobility Transistor Structures

Applied Physics Letters

English

InP Optical Constants Between 0.75 and 5.0 eV Determined by Variable‐angle Spectroscopic Ellipsometry

Journal of Applied Physics

English

Studies of Thin Strained InAs, AlAs, and AlSb Layers by Spectroscopic Ellipsometry

Journal of Applied Physics

English

Mechanical, Geometrical, and Electrical Characterization of Silicon Membranes for Open Stencil Masks

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

English

Thickness Analysis of Silicon Membranes for Stencil Masks

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

English