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Publications by J. B. Roldán

Role of Surface-Roughness Scattering in Double Gate Silicon-On-Insulator Inversion Layers

Journal of Applied Physics

English

Related publications

Surface Roughness at the Si–SiO2 Interfaces in Fully Depleted Silicon-On-Insulator Inversion Layers

Journal of Applied Physics

English

Electron Mobility in Double Gate Silicon on Insulator Transistors: Symmetric-Gate Versus Asymmetric-Gate Configuration

Journal of Applied Physics

English

Monte Carlo Simulation of Double Gate Silicon on Insulator Devices Operated as Velocity Modulation Transistors

Applied Physics Letters

English

Roughness Analysis in Strained Silicon-On-Insulator Wires and Films

Journal of Applied Physics

English

Enhanced Spontaneous Raman Scattering in Silicon Photonic Crystal Waveguides on Insulator

Molecular Physics,

English

Phonon-Boundary Scattering in Thin Silicon Layers

Applied Physics Letters

English

A Comprehensive Model for Coulomb Scattering in Inversion Layers

Journal of Applied Physics

English

Effect of Double-Patterning and Double-Etching on the Line-Edge-Roughness of Multi-Gate Bulk MOSFETs

IEICE Electronics Express

Electronic Engineering

Condensed Matter Physics

Magnetic Materials

English

Influence of Self-Affine Roughness on Parsons-Zobel Plots for Electrical Double Layers

Physical Review E

English