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Publications by J. C. J. van der Donck
Deep Sub-Wavelength Metrology for Advanced Defect Classification
Coacervation in Aqueous Solutions of Short Chain Tetraalkylammonium Bromide and Sodium Silicate
Langmuir
Surfaces
Materials Science
Condensed Matter Physics
Interfaces
Electrochemistry
Spectroscopy
Medicine
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Application of Measurement Configuration Optimization for Accurate Metrology of Sub-Wavelength Dimensions in Multilayer Gratings Using Optical Scatterometry
Applied Optics
Flying Metrology and Defect Identification for Aircraft Surface Inspection
PhotonicsViews
Feasibility Demonstration of a Massively Parallelizable Optical Near-Field Sensor for Sub-Wavelength Defect Detection and Imaging
Scientific Reports
Multidisciplinary
Metallic Transmission Screen for Sub-Wavelength Focusing
Electronics Letters
Electronic Engineering
Electrical
At-Wavelength Metrology on Sc-Based Multilayers for the UV and Water Window
Metrology Aspects of SIMS Depth Profiling for Advanced ULSI Processes
Stacked Dielectric Gratings for Sub-Wavelength Surface Field Synthesis
Journal of the Optical Society of America B: Optical Physics
Nonlinear Physics
Optics
Atomic
Statistical
Molecular Physics,
Deep Phenotyping: Deep Learning for Temporal Phenotype/Genotype Classification
Plant Methods
Biotechnology
Plant Science
Genetics
At-Wavelength Metrology of X-Ray Optics at Diamond Light Source
