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Publications by J. Kraft

X-Ray Nanodiffraction Analysis of Stress Oscillations in a W Thin Film on Through-Silicon Via

Journal of Applied Crystallography

Molecular Biology

English

Related publications

High-Resolution X-Ray Study of Thin GaN Film on SiC

Journal of Applied Physics

English

X-Ray Scattering Studies of Amorphous Thin Film Materials

Acta Crystallographica Section A: Foundations and Advances

Materials Science

Condensed Matter Physics

Theoretical Chemistry

Structural Biology

Inorganic Chemistry

English

Reply to Comment on ``X‐Ray Stress Topography of Thin Films on Germanium''

Journal of Applied Physics

English

Light Trapping in Thin-Film Silicon Solar Cells via Plasmonic Metal Nanoparticles

English

X-Ray Nanodiffraction Studies of Ionically Controlled Nanoscale Phase Separation in Cobaltites

Physical Review Materials

Materials Science

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Integration of Amorphous and Polycrystalline Silicon Thin-Film Transistors Through Selective Crystallization of Amorphous Silicon

Applied Physics Letters

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Pole Figure and Residual Stress Measurement of Thin Film Materials by X-Ray Diffraction Method Using a Two-Dimensional Detector

Journal of The Surface Finishing Society of Japan

English

Fast Oscillations in Variable X-Ray Sources and X-Ray Bursters

International Astronomical Union Colloquium

English

Blue-Enhanced Thin-Film Photodiode for Dual-Screen X-Ray Imaging

Applied Physics Letters

English