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Publications by J. M. Freitag

Nonspecular X-Ray Reflectivity Study of Roughness Scaling in Si/Mo Multilayers

Journal of Applied Physics

English

Related publications

Improved Reflectance and Stability of Mo-Si Multilayers

Optical Engineering

Molecular Physics,

English

The Characterization of Interface Roughness and Other Defects in Multilayers by X-Ray Scattering

Science and Technology of Nanostructured Magnetic Materials

English

DNA Adsorption at Functionalized Si/Buffer Interfaces Studied by X-Ray Reflectivity

Journal of Chemical Physics

Theoretical Chemistry

English

X-Ray-Absorption Study of Chemical Short-Range Order in the amorphousFe40Ni40P14B6andCo70(Si,B)23Mn5(Fe,Mo)2alloys

Physical Review B

English

Thermal Conduction Properties of Mo/Si Multilayers for Extreme Ultraviolet Optics

Journal of Applied Physics

English

X-Ray Reflectivity Study on Gold Films During Sputter Deposition

Surface Science

Condensed Matter Physics

Materials Chemistry

English

Soft X-Ray Magnetic Scattering Study of Thin Films and Multilayers

Materials Research Society Symposium - Proceedings

Mechanics of Materials

Materials Science

Condensed Matter Physics

Mechanical Engineering

English

Fitness Function and Nonunique Solutions in X-Ray Reflectivity Curve Fitting: Crosserror Between Surface Roughness and Mass Density

Journal of Physics D: Applied Physics

Condensed Matter Physics

Magnetic Materials

English

X-Ray Metrology by Diffraction and Reflectivity

AIP Conference Proceedings

English