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Publications by J. Nel
Electrical Characterization of Defects Introduced During Sputter Deposition of Tungsten on N Type 4 H -SiC
Materials Science in Semiconductor Processing
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Related publications
Electrical Characterization of Sputter Deposition Induced Defects in N-GaN
MRS Internet Journal of Nitride Semiconductor Research
Electroless Deposition and Electrical Characterization of N- Cu2O Layer
Bayero Journal of Pure and Applied Sciences
Metastable Defects in Low-Energy Electron Irradiated N-Type 4h-SiC
Materials Science Forum
X-Ray Reflectivity Study on Gold Films During Sputter Deposition
Surface Science
Surfaces
Condensed Matter Physics
Interfaces
Materials Chemistry
Films
Coatings
Magnetism and Electrical Conductivity of Nonequilibrium Fe-Bi Alloys Produced by Sputter-Deposition
Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Mechanics of Materials
Alloys
Materials Chemistry
Condensed Matter Physics
Metals
Electrical Characterization of Defects Induced by Electron Beam Exposure in Low Doped N -GaAs
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
High Energy Physics
Instrumentation
Nuclear
Characterization of MOS Capacitors Fabricated on N-Type 4h-SiC Implanted With Nitrogen at High Dose
Materials Science Forum
Localization and Electrical Characterization of Interconnect Open Defects
IEEE Transactions on Semiconductor Manufacturing
Electronic Engineering
Industrial
Condensed Matter Physics
Manufacturing Engineering
Optical
Electrical
Magnetic Materials
Electronic
Modelling of Reactive Sputter Deposition of Oxynitrides
