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Publications by J. Tanimura
A Site- And Layer-Specific Sample Preparation Technique for Plan View TEM of Laser Diodes
Microscopy and Microanalysis
Instrumentation
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A Filtration Based Technique for Simultaneous SEM and TEM Sample Preparation for the Rapid Detection of Pathogens
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TEM Sample Preparation for Microcompressed Nanocrystalline Ni
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Optimization of Ion Millers for TEM Sample Preparation
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FIB Dual-Beam Sample Preparation for TEM Observation
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Streamlining Sample Preparation of Semiconductor Materials With a New Site-Specific Cleaving Technology
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Automated S/Tem Sample Preparation for Semiconductor Process Support
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Advances in Dual Beam TEM Sample Preparation
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