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Publications by J. Ulanski
Correlation Between Surface Morphology and Potential Profile in OFETs With Zone-Cast TIPS-Pentacene as Seen by Scanning Kelvin Probe Microscopy
Materials Science-Poland
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Related publications
Changes in Plasma Membrane Surface Potential of PC12 Cells as Measured by Kelvin Probe Force Microscopy
PLoS ONE
Multidisciplinary
Micromachined Silicon Cantilevers and Tips for Scanning Probe Microscopy
Microelectronic Engineering
Surfaces
Electronic Engineering
Condensed Matter Physics
Electronic
Molecular Physics,
Nanoscience
Optical
Electrical
Atomic
Magnetic Materials
Films
Nanotechnology
Optics
Coatings
Single-Nanoparticle-Terminated Tips for Scanning Probe Microscopy
Potential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy
Direct Imaging of Defect Formation in Strained Organic Flexible Electronics by Scanning Kelvin Probe Microscopy
Scientific Reports
Multidisciplinary
Influence of Film Structure and Light on Charge Trapping and Dissipation Dynamics in Spun-Cast Organic Thin-Film Transistors Measured by Scanning Kelvin Probe Microscopy
Applied Physics Letters
Astronomy
Physics
Analysis of Surface Defects of Aluminum and Its Alloys With a Scanning Kelvin Probe
Devices and Methods of Measurements
Scanning Probe Microscopy
Scanning Probe Microscopy
