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Publications by J.F. Zhang

As-Grown-Generation (AG) Model of NBTI: A Shift From Fitting Test Data to Prediction

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
2018English

BEPCII Interaction Region Design and Construction Status

English

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