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Publications by J.J. Rehr
Mass Absorption Coefficient of Tungsten and Tantalum, 1450 eV to 2350 eV: Experiment, Theory, and Application
Journal of Research of the National Institute of Standards and Technology
Engineering
X-Ray Absorption Near Edge Theory. Final Report
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Interpretation of Luminescence in GaAs : Cr : 0.839 eV and 0.574 eV Lines
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Schools at 1020 eV and Beyond
Nature
Multidisciplinary
