Discover open access scientific publications

Search, annotate, share and cite publications

Publications by J.M. Nel

Electrical Characterization of Defects Induced by Electron Beam Exposure in Low Doped N -GaAs

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

High Energy Physics

Instrumentation

English

Related publications

Electrical Characterization of Sputter Deposition Induced Defects in N-GaN

MRS Internet Journal of Nitride Semiconductor Research

English

The Fine Structure of Electron Irradiation Induced EL2-like Defects in N-GaAs

Journal of Applied Physics

English

Electrical Characteristics of GaAs Schottky Contacts Fabricated by Electron-Beam Deposition Technique.

English

Electrical Characterization of P‐GaAs Epilayers Disordered by Doped Spin-On-Glass

Journal of Applied Physics

English

Pulsed Electron Beam Induced Recrystallization and Damage in GaAs

Applied Physics Letters

English

Optical Characterization of Si‐doped InAs1−xSbxgrown on GaAs and GaAs‐coated Si by Molecular‐beam Epitaxy

Journal of Applied Physics

English

Electrical and Photoelectrical Characterization of Deep Defects in Cubic GaN on GaAs

MRS Internet Journal of Nitride Semiconductor Research

English

Optically Active Defects Induced by 10 MeV Electron Beam in Transparent MgAl2O4 Ceramics

KnE Materials Science

English

Effect of Atomic Hydrogen Exposure on Electron Beam Polarization From Strained GaAs Photocathodes

AIP Conference Proceedings

English