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Publications by J.P. Viterelli
Focused Ion Beam: Much More Than a Sample Preparation Tool
Microscopy and Microanalysis
Instrumentation
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Focused Ion Beam Based Sample Preparation Techniques
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A Sample Preparation Method for Paper Cross-Sections Using a Focused Ion Beam.
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Dual-Beam Focused Ion Beam: A Multifunctional Tool for Nanotechnology
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High Throughput Sample Preparation and Analysis Using an Inductively Coupled Plasma (ICP) Focused Ion Beam Source
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A Plan-View TEM Specimen Preparation Method Using Focused Ion Beam
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Marriage of Focused and Broad Ion Beam: Sample Preparation Optimized for High Performance Analytical (S)TEM
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Focused Ion Beam Tomography
Focused Ion Beam-Sem as a Tool for Versatile Quantitative Imaging of Cellular Structures
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