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Publications by JC H Spence
Using STEM Image as a Map for Parallel Beam Electron Diffraction From a Nano-Particle on a TEM-STEM System
Microscopy and Microanalysis
Instrumentation
Related publications
Nano-Scale Strain Mapping Using Advanced STEM With a Direct Electron Detector
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Advances and Accuracy Considerations on Crystal Structure Refinement Using Highly Dynamical Electron Diffraction Data Generated With a Parallel Electron Beam
Acta Crystallographica Section A Foundations of Crystallography
Measurement of Strain in Nanoporous Gold Using Nano-Beam Electron Diffraction
Nano Structures Studied by Convergent Beam Electron Diffraction
Acta Crystallographica Section A Foundations of Crystallography
The Accuracy of Crystal Structure Refinement From Electron Diffraction Data Using Parallel Beam Illumination
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High-Throughput, Semi-Automated Quantitative STEM Atom Counting in Supported Metal Nanoparticles Using a Conventional TEM/STEM
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Advances in STEM-CELL. A Free Software for TEM and STEM Analysis and Simulations: Probe Deconvolution in STEM-HAADF
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Resolution and Image Fidelity in STEM and TEM (HREM)
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Image Recording Systems in TEM and Quantitative Analysis of Electron Diffraction.
Materia Japan
