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Publications by JN Eckstein
Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS
Microscopy and Microanalysis
Instrumentation
Related publications
Atomic-Resolution EELS in Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
Aberration-Corrected STEM for Elemental Mapping
Microscopy and Microanalysis
Instrumentation
Aberration Corrected STEM-EELS Study of the Hole Distribution in Cuprate Superconductors
Microscopy and Microanalysis
Instrumentation
Aberration-Corrected ETEM: In-Situ Reduction of Cobalt Oxides
Microscopy and Microanalysis
Instrumentation
The Ultimate Resolution in Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
Surface Channeling in Aberration-Corrected STEM of Nanostructures
Microscopy and Microanalysis
Instrumentation
Nanomilling for Aberration – Corrected TEM and HAADF STEM
Microscopy and Microanalysis
Instrumentation
Understanding Catalyst Stability Through Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
Using Neural Network Algorithms for Compositional Mapping in STEM EELS
Microscopy and Microanalysis
Instrumentation
