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Publications by Jacob T. Boyer
Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis
Microscopy and Microanalysis
Instrumentation
Related publications
Focused Ion Beam (FIB) Based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)
Microscopy and Microanalysis
Instrumentation
Comparison of Dislocation Mapping Using Electron Channeling Contrast Imaging and Cross-Correlation Electron Backscattered Diffraction
Microscopy and Microanalysis
Instrumentation
Observation of Substructure in Steels and Ni200 Using Electron-Channeling Contrast Imaging
Microscopy and Microanalysis
Instrumentation
A Semi-Automated Image Analysis Procedure for in Situ Plankton Imaging Systems
PLoS ONE
Multidisciplinary
Imaging Basal Plane Stacking Faults and Dislocations in (11-22) GaN Using Electron Channelling Contrast Imaging
Journal of Applied Physics
Astronomy
Physics
Behavior of Misfit Dislocations in GaAs Layers Grown on Si at Low Temperature by Molecular Beam Epitaxy
Whole-Slide Imaging and Automated Image Analysis
Veterinary Pathology
Veterinary
Ion Channeling Contrast Imaging of Aluminum Wire Bonds
Microscopy and Microanalysis
Instrumentation
Quantitative Imaging of Electron Density and Effective Atomic Number Using Phase Contrast CT
Physics in Medicine and Biology
Radiological
Radiology
Nuclear Medicine
Ultrasound Technology
Imaging
