Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by James J. Tunney
Transmission Electron Microscopy Investigation of Interfacial Reactions Between SrFeO3 Thin Films and Silicon Substrates
Journal of Materials Research
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Thermal Stability of SrFeO3/Al2O3 Thin Films: Transmission Electron Microscopy Study and Conductometric Sensing Response
Journal of Applied Physics
Astronomy
Physics
Related publications
Transmission Electron Microscopy Study of FeHfN Thin Films for Magnetic Properties Optimization and Integration Above Silicon Circuits.
Microscopy and Microanalysis
Instrumentation
Nanocrystalline Silicon Thin Films on PEN Substrates
Thin Solid Films
Surfaces
Alloys
Optical
Interfaces
Metals
Materials Chemistry
Magnetic Materials
Films
Coatings
Electronic
Interfacial Phonon Scattering and Transmission Loss in >1 Μm Thick Silicon-On-Insulator Thin Films
Physical Review B
Optical
Electronic
Condensed Matter Physics
Magnetic Materials
Investigation of Grain Boundaries in BaSi2 Epitaxial Films on Si(1 1 1) Substrates Using Transmission Electron Microscopy and Electron-Beam-Induced Current Technique
Journal of Crystal Growth
Inorganic Chemistry
Materials Chemistry
Condensed Matter Physics
Nano-Indentation of Copper Thin Films on Silicon Substrates
Scripta Materialia
Mechanics of Materials
Materials Science
Alloys
Condensed Matter Physics
Mechanical Engineering
Metals
Nanoscience
Nanotechnology
Interfacial and Microstructural Properties of SrTiO3 Thin Films Grown on Si(001) Substrates
Journal of Applied Physics
Astronomy
Physics
Electron Diffraction and High-Resolution Transmission Microscopy Studies of Nanostructured Si Thin Films Deposited by Radiofrequency Dusty Plasmas
Thin Solid Films
Surfaces
Alloys
Optical
Interfaces
Metals
Materials Chemistry
Magnetic Materials
Films
Coatings
Electronic
Investigation of 6T@SWCNT by Cs-Corrected Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
