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Publications by Jan Smolík
Kelvin Probe Force Microscopy of the Nanoscale Electrical Surface Potential Barrier of Metal/Semiconductor Interfaces in Ambient Atmosphere
Beilstein Journal of Nanotechnology
Electronic Engineering
Materials Science
Nanoscience
Electrical
Nanotechnology
Astronomy
Physics
Related publications
Changes in Plasma Membrane Surface Potential of PC12 Cells as Measured by Kelvin Probe Force Microscopy
PLoS ONE
Multidisciplinary
Potential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy
Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy
Internal Potential Mapping of Charged Solid-State-Lithium Ion Batteries Using in Situ Kelvin Probe Force Microscopy
Nanoscale
Materials Science
Nanotechnology
Nanoscience
Dynamically Visualizing Battery Reactions by Operando Kelvin Probe Force Microscopy
Communications Chemistry
Biochemistry
Environmental Chemistry
Materials Chemistry
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Direct Measurement of Minority Carriers Diffusion Length Using Kelvin Probe Force Microscopy
Applied Physics Letters
Astronomy
Physics
Direct Assessment of P–n Junctions in Single GaN Nanowires by Kelvin Probe Force Microscopy
Nanotechnology
Mechanics of Materials
Electronic Engineering
Mechanical Engineering
Materials Science
Nanoscience
Electrical
Bioengineering
Nanotechnology
Chemistry
Investigation of the Cleaved Surface of a P–i–n Laser Using Kelvin Probe Force Microscopy and Two-Dimensional Physical Simulations
Applied Physics Letters
Astronomy
Physics
Nonlinear Surface Electromagnetic Waves at Metal-Semiconductor Interfaces
Le Journal de Physique Colloques
