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Publications by Jeffrey K. Farrer
Boundary Migration in Rutile
Microscopy and Microanalysis
Instrumentation
Related publications
Secondary-Phase-Assisted Grain Boundary Migration in CuInSe2
Physical Review Letters
Astronomy
Physics
Grain Boundary Migration in Thin Films Using Monte Carlo Method
Anales de la Asociacion Fisica Argentina
Astronomy
Physics
A Numerical Method for Curvature Driven Boundary Migration
Modelling and Simulation in Materials Science and Engineering
Mechanics of Materials
Materials Science
Condensed Matter Physics
Simulation
Computer Science Applications
Modeling
Boundary Migration in a 3D Deformed Microstructure Inside an Opaque Sample
Scientific Reports
Multidisciplinary
Growth of Deformation Twins in Tantalum via Coherent Twin Boundary Migration
Journal of Applied Physics
Astronomy
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Reconciling Grain Growth and Shear-Coupled Grain Boundary Migration
Nature Communications
Astronomy
Genetics
Molecular Biology
Biochemistry
Chemistry
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Molecular Dynamics Simulation of Grain Boundary Formation and Migration in Silicon
Materials Transactions
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Effect of Grain Boundary Migration in Solution Treatment on Grain Boundary Precipitation of Al-Fe Dilute Alloys
Keikinzoku/Journal of Japan Institute of Light Metals
Mechanics of Materials
Alloys
Materials Chemistry
Metals
Mechanical Engineering
High Resolution Microscopy Study of [001] Symmetric Tilt Boundary With a Tilt Angle of 66° in Rutile-Type TiO2 Bicrystal
Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Mechanics of Materials
Alloys
Materials Chemistry
Condensed Matter Physics
Metals
